65☌ to 300☌ operating temperature rangesĪvailable in regular low leakage (5 femto amps per volt)ĪttoFast™ with guarded tips for 2 femto amp per volt settling time This allows the user to take a fast measurement while a system is in a settling or thermal stabilization mode and helps compensate for wafer expansion. Minitile™ with Advanced Cantilever™ technology and WedgeTile™Įach probe is designed for wide temperature ranges and so the probe expansion characteristics are closely matched to the wafer’s expansion characteristics. Sub-fA level leakage measurements availableĬompatible with quick disconnect triaxial cable harnesses Temperature compensated for use from-65☌ to 300☌ Optimized for DC parametric test and single site WLRĬompatible with standard 4.5″ rectangular edge card holders The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations. The 40 mm tile was designed for mounting on a standard 4.5″ probe card holder. Ultra low noise and fast settling modeling and characterization tests are made possible by Celadon’s patented ceramic probe cards. Both designs of the VC43 are compatible with direct dock Parametric Testers and with cabled out solutions to support rack and stack testing.Įffective operating temperature range from -65° to 200☌ The VC43EAF is an option offered as a sister product to the VC43™. Cards can be configured up to 104 probes in either single or dual layer with near vertical probes to minimize scrub lengths on pads allowing the VC43s to probe pads as small as 30 microns.Ĭeladon’s proven AttoFast™ technology has been integrated into the VC43™ probe card resulting in superior leakage performance, low and more stable capacitance while retaining the flexibility of a modular probe card system. The VC43™ can be used for production parametric test, modeling, characterization, and wafer level reliability testing. In addition to saving time, another advantage of the modularity is the ability to leave the interface in place and simply install the VC43™ topside using Celadon’s twist and lock insertion tool which minimizes the possibility of triboelectric or interconnect issues that can occur during typical probe card changes. The VC43™ Element Series probe card is modular and can be quickly and easily installed into a variety of industry compatible probing platforms including: MPPT, Verigy, P9000 or other custom solutions including cabled-out interfaces. VC43™/VC43EAF™ PROBE CARDS OFFER A LARGER FORMAT VERSION OF THE POPULAR VC20™ Using the customizable PCB, components can be added to create a “golden core” to quickly troubleshoot your system The diagnostic cores are uniquely designed in the VC20™ with Advanced Cantilever™ technology format. The Air Ready Indexer has all of the features as the standard Indexer with the addition of the option of customer added CDA at the probe card Tested for hundreds of thousands of touchdowns. The patented Indexer™ is the industry’s first automatic probe card changer designed for lights out parametric test.Ĭan support up to five VC20™’s with Advanced Cantilever™ technology, any variety Interested In Production Parametric Probe? Probes can be configured in either single or dual layer If you require faster settling time, click here Optimized for DC parametric test, modeling and characterization, and single site WLRĬan be quickly installed using an interface tool into various interfaces and takes minimal storage space on the test floorĮffective operating temperature range from -65° to 200° C It can be easily combined with different interfaces to create modular probe cards supporting Keithley, Keysight or other custom tester platforms. The 20mm VC20™ with Advanced Cantilever™ technology is a highly adaptable probe card solution for a wide variety of tests including Modeling & Characterization, Wafer Level Reliability or Parametric Test.
0 Comments
Leave a Reply. |